•  32
    Conceptual clarification and implicit-association tests: psychometric evidence for racist attitudes
    European Journal for Philosophy of Science 8 (1): 51-70. 2018.
    Critics of the Implicit Association Test —a measure of the strength of a person’s automatic, memory-based association between two concepts, such as “black” and “threatening” or “white” and “caring”—have at least three main objections. Their symmetry argument is that the IAT should but does not give equally valid results for black-on-white and white-on-black racism. Their cultural-awareness argument is that the IAT illegitimately presupposes that use of racial stereotypes presupposes no stereotyp…Read more
  •  17
  • Electronics for the BaBar central drift chamber
    with Albert J., A. Bajic, R. Bard, M. Beaulieu, V. Blinov, A. Boyarski, B. Broomer, D. Coupal, F. Dal Corso, S. Dolinsky, D. Dorfan, S. Dow, M. Dubrovin, J. Dusatko, E. Erdos, R. Faccini, J. P. Fernandez, W. T. Ford, F. Galeazzi, G. Haller, W. Innes, A. Jawahery, H. Kreig, A. J. Lankford, Levi M., H. Von Der Lippe, D. B. MacFarlane, J. P. Martin, M. Momayezi, M. Morandin, M. Morii, D. Nelson, P. Nguyen, M. Palrang, Roy J., H. Sadrozinski, B. Schumm, G. Sciolla, A. Seiden, A. J. S. Smith, A. Soha, P. Taras, E. Varnes, A. Weinstein, F. Wilson, and A. Yushkov
    The central drift chamber for the BaBar detector at the SLAC B-factory is based on a hexagonal cell design with 7104 cells arranged in 40 layers and drift gas Helium:isobutane. Performance optimization and integration requirements led to an electronics design that mounts the amplifier-discriminator and digitizing circuitry directly on the endplate. High channel density is achieved using a 4-channel custom amplifier-discriminator IC and an 8-channel custom CMOS TDC/FADC IC on a single circuit boa…Read more